Variation of electronic structures of CeAl2 thin films with thickness studied by X-ray absorption near-edge structure spectroscopy, C.L. Dong, K. Asokan, C.L. Chang, C.L. Chen, P.C. Lee, P.C. Chen, Y.Y. Chen, J.F. Lee and J.-H. Guo, J. Electron Spectrosco

Variation of electronic structures of CeAl2 thin films with thickness studied by X-ray absorption near-edge structure spectroscopy, C.L. Dong, K. Asokan, C.L. Chang, C.L. Chen, P.C. Lee, P.C. Chen, Y.Y. Chen, J.F. Lee and J.-H. Guo, J. Electron Spectroscopy and Related Phenomena, 152 (2006) 1.