Research Areas

Publication

List of Publications

  • Effects of swift heavy ions on the dielectric properties of doped and undoped ammonium dihydrogen phosphate crystals. A P Bhat, P S Aithal, P Mohan Rao, D K Avasthi; Nucl. Instru. Methods in Phys. Res.B 166-167 ( 2000 ) 964.

  • Dependence on cation distribution of particle size, lattice parameter, and magnetic properties in nanosize Mn-Zn ferrite; Chandana Rath, S. Anand, R.P. Das, K.K. Sahu, S.D. Kulkarni, S.K. Datta and N.C. Mishra; J. Appl Phys. 91(4), 2211-2215 (2002)

  • Granularity controlled percolative current conduction in YBa2Cu3O7/Ag composite thick films; D. Behera and N.C. Mishra; Supercond. Sci. Technol. 15, 72-81 (2002)

  • Mossbauer study of nanosize Mn1-xZnxFe2O4; C. Upadhyay, H.C. Verma, C. Rath, K.K. Sahu, S. Anand, R.P. Das and N.C. Mishra; J. Alloys and Compounds 326, 94 (2001)

  • Temperature dependent roughness of electronically excited InP surfaces; J.P.Singh, R. Singh, N.C. Mishra, V. Ganesan, and D. Kanjilal; J. Appl. Phys. 90, 5968 (2001).

  • Nanoscale Defect Formation on InP Surface due to Swift Gold Ion Impact; J.P. Singh, R. Singh, N.C. Mishra, V. Ganesan and D. Kanjilal; Nuclear Instruments and Methods in Physics Research B 179, 37-41 (2001)

  • Irradiation Induced Inter- and Intra-granular Modifications by 120MeV S Ions in YBa2Cu3O7-x Thick Films.;D. Behera, K. Patnaik and N.C. Mishra; Mod. Phys. Lett. B15(2), 69-80 (2001)

  • In Situ Current-Voltage Characterization Of Swift Heavy Ion Irradiated Au/N-Gas Schottky Diode At Low Temperature, R.Singh, S. K. Arora, J.P.Singh and D. Kanjilal, Radiation Effects & Defects in Solids (in Press).

  • Temperature Dependence of 1/F Noise In Pd/N-Gaas Schottky Barrier Diode, R. Singh and D. Kanjilal, J. Appl. Phys., 91 (1), 411 (2002).

  • 50 MeV Li3+ irradiation effects on the thermal expansion of Cal-xSrxZr4P6O24 , Basavaraj Angadi, V.M. Jali, M.T. Lagare, N.S. Kini, A.M. Umarji, Ravi Kumar, S.K. Arora and D. Kanjilal, Nucl. Instr. and Methods in Phys. Res. B,187 (1), 87(2002).

Back to Top