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Comment on “Characterization of As-doped, p-type ZnO by x-ray absorption near-edge structure spectroscopy: Theory” Appl. Phys. Lett., 89, 222113 (2006), V. Vaithianathan, S.S.Kim, and K.Asokan, Appl. Phys. Lett. 92, (2008)236101.