- Read more about Ion beam modification of strained InGaAs/InP characterized by HRXRD, PL and AFM, G. Devaraju, S. Dhamodaran, A.P. Pathak, G. Sai Saravanan, J. Gaca, M. Wojcik, A. Turos, S.A. Khan, D.K. Avasthi, B.M. Arora, Nucl. Instr. and Meth. B. 266 (2008) 3552.
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